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Suppression of Interface State Generation in Si MOSFETs with Biaxial Tensile StrainYI ZHAO; TAKENAKA, Mitsuru; TAKAGI, Shinichi et al.IEEE electron device letters. 2011, Vol 32, Num 8, pp 1005-1007, issn 0741-3106, 3 p.Article

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Morphology of electrodeposited Ni/Cu multilayer : Specular and diffuse neutron reflectometry studyBASU, Saibal; SINGH, Surendra; GHOSH, S. K et al.Physica. B, Condensed matter. 2006, Vol 385-86, pp 656-658, issn 0921-4526, 3 p., 1Conference Paper

Detection of nano scale thin films with polarized neutron reflectometry at the presence of smooth and rough interfacesJAHROMI, Saeed S; SEYED FARHAD MASOUDI.Applied physics. A, Materials science & processing (Print). 2010, Vol 99, Num 1, pp 255-263, issn 0947-8396, 9 p.Article

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Simulations of surface roughness effects in planar superlensesSCHØLER, Mikkel; BLAIKIE, Richard J.Journal of optics. A, Pure and applied optics (Print). 2009, Vol 11, Num 10, issn 1464-4258, 105503.1-105503.6Article